Sharper, Smarter, Faster: ZYGO’s 2025 Metrology Innovations
Visitors to CONTROL 2025 in Stuttgart, taking place from May 6–9, will have the opportunity to experience the latest advancements in optical metrology as Zygo—part of AMETEK and a global leader in precision metrology and optical solutions—presents a selection of its 3D optical profilers at Booth 9501 in Hall 09. Highlights will include the ZeGage Pro and NewView 9000 systems.
With more than 50 years of innovation in precision metrology, Zygo is recognized for its leadership in non-contact surface measurement. CONTROL 2025 provides an ideal platform for the company to showcase how its technologies continue to raise the bar in both manufacturing and research applications.
At the heart of Zygo’s exhibition is its world-leading Coherence Scanning Interferometry (CSI) technology. Both the ZeGage Pro and NewView 9000 leverage CSI to deliver fast, non- destructive, sub-nanometer measurements — regardless of surface type. This makes them indispensable tools for industries that rely on surface precision, from semiconductors to optics, automotive, and aerospace.
The ZeGage Pro brings their world-class optical metrology into a compact, benchtop form factor — ideal for shop floor deployment. It provides comprehensive 3D characterization of micro- and nano-scale surface features, ensuring high-throughput quality control without compromising precision. Meanwhile, the NewView 9000 stands out for its modularity and versatility, capable of analyzing flatness, roughness, thin films, step heights, and more. Visitors to CONTROL will see firsthand how its flexibility — alongside their powerful Mx software platform — can be tailored to any metrology workflow.
In addition to hardware platforms, they will be highlighting accessory innovations that extend performance and application reach. One standout is the 0.5x ZWF (Zygo Wide Field) objective, purpose-built to accelerate measurements across large areas. With a field of view up to 35mm and a 45mm working distance, this objective is already transforming workflows in sectors like semiconductor inspection, AR waveguide metrology, and large-part precision machining. By significantly reducing stitching requirements, the 0.5x ZWF boosts throughput without compromising accuracy.
“CONTROL is where quality meets innovation,” says Peter Kuschnir, European Sales Manager at Zygo. “We’re excited to showcase how Zygo’s systems combine precision, speed, and usability. Whether you’re inspecting an advanced optical assembly or need in- line process monitoring, we have the right tools and the right team to support you.”
They invite attendees to explore its portfolio, meet with technical experts, and discover how its solutions can optimize production outcomes.
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